Characterization of Ultra-Thin Diamond-Like Carbon Films by SEM/EDX
نویسندگان
چکیده
A novel, high throughput method to characterize the chemistry of ultra-thin diamond-like carbon films is discussed. The uses surface sensitive SEM/EDX provide substrate-specific, semi-quantitative silicon nitride/DLC stack composition protective extensively used in hard disk drives industry and at Angstrom-level. output correlated TEM direct, gauge-capable film thickness information using multiple regression models that make predictions based on constituents. best model N/Si ratio films, instead separate Si N contributions. Topography substrate/film after undergoing wear correlatively compositionally described chemical changes detected via without need for tedious cross-sectional workflows. Wear track regions substrate have a depleted carbon, as well most severe cases, also revealing iron oxide formation. Analysis variations around industry-level thicknesses reveals complex interplay between oxygen, nitrogen, which has been reflected mathematically models, valuable insights into as-deposited physics film.
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ژورنال
عنوان ژورنال: Coatings
سال: 2021
ISSN: ['2079-6412']
DOI: https://doi.org/10.3390/coatings11060729